检索结果分析
成果/Result
| 题名 | 作者 | 出处 | 被引量 | 操作 | |
|---|---|---|---|---|---|
| Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering | Liu Qi-Ya[1,2];Fang Ze-Bo[2];J | CHINESE PHYSICS LETTERS | 12 | ||
| Energy band diagram of metal/Tm2O3/Si stack structure acquired from the study of leakage current mechanisms | Yao, Bo[1];Zhu, Yanyan[1];Fang | THIN SOLID FILMS | 7 | ||
| Structural and Electrical Characteristics of Amorphous ErAlO Gate Dielectric Films | Zhu Yan-Yan[1,2];Fang Ze-Bo[1] | CHINESE PHYSICS LETTERS | 3 |
