检索结果分析
成果/Result
| 题名 | 作者 | 出处 | 被引量 | 操作 | |
|---|---|---|---|---|---|
| Reliability study of the band gap of rare earth oxides measured by XPS spectra | Yang Xiaofeng[1,2];Tan Yongshe | MICRO-NANO TECHNOLOGY XIV, PTS 1-4 | 2 | ||
| Charge storage characteristics of Ni-NiOx core-shell nanocrystals embedded in SiO2 gate oxide | Ni, Henan[1,2]; Wu, Liangcai[3 | Key Engineering Materials | 0 |
