文献类型：会议论文

英文题名：Test systems for life of LED light based on junction temperature

作者：Huang, De Zhong[1]; Wu, Ji Hua[1]; Xu, Guo Yong[2]; Ruan, Feng[2]; Zhao, Xiao Bao[2]; Wang, Guo Hua[2]

机构：[1] School of Mechanical Engineering, Shaoxing University, Shaoxing, 312000, China; [2] Zhejiang Tianeb Solar energy technology co, LTD, Zhejiang, Shaoxing, 312000, China

会议论文集：Materials and Processes Technologies V

语种：英文

外文关键词：Regression analysis - Testing

外文摘要：In order to predict the life of white LED in a short time, three groups constant stress accelerated life tests were conducted by increasing the working current. Life information of LEDs was obtained by using bilinear regression method. The numerical results indicated that the scheme of the accelerated life tests was correct and feasible. The estimation of the LED life was accurate by acceleration parameters. ? (2014) Trans Tech Publications, Switzerland.