文献类型：期刊文献

中文题名：任意极性或-符合型易测性网络及测试集

英文题名：Easily testable network of arbitrary polarity OR-Coincidence type and test sets

作者：潘张鑫[1];陈偕雄[2];阮谢永[1]

机构：[1]绍兴文理学院物理与电子工程系;[2]浙江大学信息与电子工程学系

年份：2008

卷号：42

期号：3

起止页码：407

中文期刊名：浙江大学学报：工学版

外文期刊名：Zhejiang Daxue Xuebao (Gongxue Ban)/Journal of Zhejiang University (Engineering Science)

收录：CSTPCD、、EI(收录号：20081811231912)、北大核心2004、Scopus(收录号：2-s2.0-42549111662)、CSCD2011_2012、北大核心、CSCD

语种：中文

中文关键词：通用测试集;可测性设计;或-符合展开;单固定故障

外文关键词：universal test set; design for testing; OR-Coincidence expansion; single stuck-at fault

中文摘要：为提高数字电路的可测性,提出了一种可实现任意逻辑函数的任意极性或-符合型易测性网络,并给出了测试网络中所有单固定故障的通用测试集.该网络基于逻辑函数的混合极性及同或积的或-符合表示,其同或部分分别采用了串联和树形结构.为提高可测性,用同或串的网络结构只需增加2个控制端及1个观察端,用同或树的网络结构只需增加4个控制端及1个观察端.对于一个n变量的逻辑函数,2种结构下通用测试集的基数分别为n+7和n+10.这种短的通用测试集非常适合用内建自测试实现,从而有效地缩短了测试时间.

外文摘要：In order to improve the testability of digital circuits, an easily testable network of arbitrary polarity OR-Coincidence type for arbitrary logic functions was proposed and the universal test sets which could detect all single stuck-at faults in the network were given. The network is based on the generalized polarity and coincidence product-of-sum OR-Coincidence expression of logical functions, and its Exclusive- NOR （EXNOR） part employs cascade or tree structure. The network of EXNOR-cascade structure only requires adding two control points and one observation point, and the one of EXNOR-tree structure only .requires adding four control points and one observation point, consequently the testability is improved. For an n-variable function, the cardinal numbers of universal test sets for the two structures are （n＋7） and （n＋10） respectively. Such short universal test sets are very suitable to be generated by Built-in Self-Test, and the test time can be saved greatly.