文献类型：期刊文献

中文题名：连续真空蒸发法制备CsPbBr_(3)薄膜及其X射线探测性能的分析

英文题名：Analysis of Preparation of CsPbBr_(3)Thin Films by Continuous Vacuum Evaporation Method and X-ray Detection Performance

作者：汪毅[1];徐海涛[1];姚博[1];方泽波[1]

机构：[1]绍兴文理学院微机电系统浙江省工程研究中心,浙江312000

年份：2024

卷号：53

期号：3

起止页码：16

中文期刊名：电子技术（上海）

外文期刊名：Electronic Technology

基金：国家自然科学基金(11905133);浙江省自然科学基金(LQ19F040002);浙江省基础公益研究计划项目(LGG21F050001)。

语种：中文

中文关键词：真空蒸发法;CsPbBr_(3)薄膜;X射线探测器

外文关键词：vacuum evaporation method;CsPbBr_(3)thin film;X-raydetector

中文摘要：阐述采用连续蒸发法制备一定厚度的CsPbBr_(3)薄膜并用于X射线探测。研究CsBr层和PbBr2层的厚度比对CsPbBr_(3)薄膜物性的影响。结果表明,在厚度比为0.85时,可获得纯立方相结构的CsPbBr_(3)薄膜,并通过衬底原位加热的方式有效解决薄膜出现龟裂而脱落的问题,同时促进薄膜晶粒的长大。制备的CsPbBr_(3)薄膜X射线探测器的光电流与X射线剂量率之间呈现出良好的线性关系。器件的线性灵敏度达1223μCGy^(-1)cm^(-2)。

外文摘要：This paper describes the preparation of CsPbBr_(3)thin films with a certain thickness using continuous evaporation method and their application in X-ray detection.Study the effect of thickness ratio of CsBr layer and PbBr_(2)layer on the physical properties of CsPbBr_(3)thin films.The results indicate that a pure cubic structured CsPbBr_(3)film can be obtained at a thickness ratio of 0.85,and the problem of film cracking and detachment can be effectively solved by in-situ substrate heating,while promoting the growth of film grains.There is a good linear relationship between the photocurrent and X-ray dose rate of the CsPbBr_(3)thin film X-ray detector prepared.The linear sensitivity of the device reaches 1223μCGy^(-1)cm^(-2).